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OSSC March Joint Meeting with OSA - Scott Jordan from Physik Instrumente
OSSC Regular Meeting
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Nano-alignment as challenge and enabler for “Silicon Photonomics”
Abstract: Engineers are confronted with challenges in planning for repetitive manufacturing of Silicon Photonics devices: needed is fast, nanoscale alignment of optical fibers, small optical elements and the actual SiP devices in test and packaging. These cannot be aligned adequately via passive approaches or using machine vision, and drift must often be corrected in real time. Prior approaches have not been suitable for the multiple, interacting inputs and outputs commonly encountered in today’s SiP devices, nor was their speed sufficient for economic application in these applications.
We provide a concise review of prior approaches and discuss their applicability and shortcomings in the face of today’s emerging SiP architectures. The unmet challenges have led to the introduction of a novel, multichannel-capable active alignment technology that has been integrated into wafer probers and volume packaging systems. It performs global optimization across the inputs and outputs of complex SiP devices in one rapid step, facilitating functional and parametric testing and packaging operations with high throughput. Speed improvements can exceed two orders of magnitude.
Reception with light hors d'oeuvres:
$25 ($30 after 15 March)
OSSC Student Members $10 ($15 after 15 March)
Presentation without reception is FREE, but registration required
Parking: On your own (South Hall lot is convenient)
Please Register by Wednesday 15 March 2017