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HomeEventsOSSC March 14 Meeting

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OSSC March 14 Meeting

When:
Wednesday, March 14, 2018
Where:
Sodexo @ Pickwick Gardens
Pickwick Conf Center
1001 West Riverside Drive
Burbank, CA  91506

818.845.5300
Contact:
Donn M Silberman
Category:
OSSC Regular Meeting
Registration is recommended
Payment In Advance Or At Event
Cancellation Policy:
Please let the Arrangements Chair ("Events@ossc.org") know as soon as possible.

Payments made in advance will normally be issued a credit that may be applied to future payments (membership or events). Please contact the Treasurer ("Treasurer@ossc.org") for assistance if this posses a significant burden.
Activities/Items    (Click the down-arrow to the left of the activity/item to view the details)
Presentation
Dinner
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An Introduction to Spectrally Controlled
Interferometry for the Measurement of Flat and Spherical Optics

          
Donald (Don) A. Pearson II
Äpre Instruments, Tucson, Arizona
Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but it is often plagued by back or multiple surface reflections.  At this meeting, a new method of isolating the measurement surface by controlling the spectral properties of the source (Spectrally Controlled Interferometry - SCI) will be described.  Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero.  As a consequence, it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau or Twyman-Green.  SCI technology does not require mechanical phase shifting, resulting in simpler instruments and offers the ability to upgrade existing interferometers.  Furthermore, SCI allows absolute measurement of distance, including radius of curvature of lenses, in a single setup with the possibility of improving the throughput and removing some of the pitfalls of inaccurate measurements.